Scanning Electron Microscope
The JEOL 6100 scanning electron microscope is an essential tool for examination of metallic fracture surfaces and other features such as etched metallographic specimens, surface finishes, and corroded surfaces at magnifications up to 10,000X. The SEM is equipped with an energy dispersive X-ray spectrometer for atomic analysis. The SEM's chamber accommodates large specimens, thus minimizing destructive cutting.